Abstract: Temperature cycle PIM test is necessary to evaluate the PIM performance of space microwave products. Unfortunately, the traditional temperature chambers through-wall waveguide connection always cause residual PIM deterioration because of stress, temperature change and other factors, which seriously affects the sensitivity and efficiency of temperature cycle PIM test. To solve this problem, a contactless low PIM through-wall technology is proposed, contactless port is designed for the through-wall structure based on the principle of contactless EM shielding, which avoids the electrical contact factors that cause PIM, by which a kind of low PIM electrical connection of the temperature chamber’s through-wall is achieved. The PIM suppression of the contactless structure is analyzed, and a Ku-band prototype is designed and test. The measured 3rd residual PIM level is less than -140dBm@2×100W under several temperature cycles, obtaining a stable low residual PIM level, which greatly improves the PIM test performance and efficiency, and can be widely used in various kinds of PIM test applications.